AFM

Overview of Services

Atomic force microscopy (AFM) utilizes a rigid cantilever to probe the surface of samples with nanoscale resolution – far surpassing the optical diffraction limit. Users typically utilize AFM for one of three major applications:

1. Quantification of tissue nano-mechanical properties (e.g. tissue stiffness),
2. Determination of topographical information (e.g. surface roughness), or
3. Quantification of nanoscale interactions (e.g. attaching an antibody to the AFM probe).

Contacts

Name Role Phone Email Location
Ryan Tomlinson, PhD
Core Director
 
215-955-5504
 
Ryan.Tomlinson@jefferson.edu
 
Curtis 504
 
Eri McLaughlin, BS
Facility Manager
 
215-955-5504
 
Eri.McLaughlin@jefferson.edu
 
Curtis 502