Atomic force microscopy (AFM) utilizes a rigid cantilever to probe the surface of samples with nanoscale resolution – far surpassing the optical diffraction limit. Users typically utilize AFM for one of three major applications:
1. Quantification of tissue nano-mechanical properties (e.g. tissue stiffness),
2. Determination of topographical information (e.g. surface roughness), or
3. Quantification of nanoscale interactions (e.g. attaching an antibody to the AFM probe).
| Name | Role | Phone | Location | |
|---|---|---|---|---|
| Ryan Tomlinson, PhD |
Core Director
|
215-955-5504
|
Ryan.Tomlinson@jefferson.edu
|
Curtis 504
|
| Eri McLaughlin, BS |
Facility Manager
|
215-955-5504
|
Eri.McLaughlin@jefferson.edu
|
Curtis 502
|